Evaluating the effects of high frequency electromagnetic radiation to electronic devices

Abstract

Electronic circuits whose main components are discrete semiconductor devices or integrated circuits (ICs) tend to grow smaller. As such, the voltage provided for the operation of the circuit is becoming lower. The electromagnetic interferences from the power source typically are significant enough to intentionally or unintentionally penetrate semiconductor electronic devices, causing degradation and sometimes event failures in electronic circuits. This paper studies the power limits of high frequency (HF) signal sources to prevent failures in electronics circuits. Experiments are done in a transmitter power supply, consisting of a waveguide system, an oscillator (magnetron), some other accessories, and an electronic circuit integrated with ICs made by TTL/CMOS technology as test objects. The results during the experiment can help determine the power level limit that can affect the electronic equipment’s operation. We also propose several applications that can apply in practical systems based on these findings.